Photograph

 李建模 James Chien-Mo Li

     Photograph

     Graduate Institute of Electronics Engineering (GIEE)
     Department of Electrical Engineering
     National Taiwan University


Contact Information

     Office: Rm 339, Electrical Engineering Buliding II-339
     E-mail: cmli AT ntu DOT edu DOT tw

Education

  • Ph.D., Stanford University
  • M.S., Stanford University
  • B.S., National Taiwan University

Teaching *contents see NTU Ceiba

  • Switching Circuit and Logic Design (EE undergrad, Fall)
  • VLSI Testing (GIEE graduate, Fall)
  • Algorithms (EE graduate/under, Spring)
  • Service Learning 2&3 (EE undergrad, Fall+Spring)

Current Research Projects

  • Automatic Test Pattern Generation
  • Fault Diagnosis and Yield Improvement
  • Low Power Testing
  • Design and Test of Nanometer Devices and Circuits
  • Defect Based Testing

Information For New Students

  • GIEE EDA graduate students
  • 大學部專題
    • 教育部CAD競賽定題組
    • design and test for nanometer circuits

Other Information

  • under construction

Publications



Last modified time: 12/2/2013