SOC Testing

• IEEE P1500 Standard for Embedded Core Test (SECT), http://grouper.ieee.org/groups/1500/
• ¡@

Universities Research Centers

• CAD and Test Group, UC Santa Barbara, http://bears.ece.ucsb.edu/
• Center for Reliable Computing (CRC),Stanford University,    http://crc.stanford.edu
• Computer Engineering Research Center(CERC), UT Austin, http://www.cerc.utexas.edu/
• Center for Reliable and High Performace Computing, (CHRC), UIUC, http://www.crhc.uiuc.edu/
• Electronic CAD and Reliability Group, Politenico di Torino, http://www.cad.polito.it/
• Lab of Reliable Computing (LaRC), National Tsing-Hwa University, http://larc.ee.nthu.edu.tw/index-intro.html
• Microelectronics and Computer System Lab (MACS), McGill University, http://www.macs.ece.mcgill.ca/
• VLSI Testing and Verification Lab, National Taiwan University,  http://hyperion.ee.ntu.edu.tw/
• VLSI Test Lab, National Cheng-Kong University,  http://beethoven.ee.ncku.edu.tw/testlab/

¡@